May 22 - 27, 2011    ミュンヘン , ドイツ
SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

開催地

Location: Munich Germany
連絡先 Messegelände, Entrance North Munich , Germany

関連イベント

SPIE Optical Metrology May 13 - 16, 2013
SPIE Optical Metrology May 22 - 27, 2011