IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR) 2013

The challenge of managing Reliability in a dynamic global market is increasing. ASTR 2013 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market. The program will feature industry leading keynote speakers and selected presentations.