IEEE International Reliability Physics Symposium (IRPS) 2011

span class="Apple-style-span" style="font-family: Arial, Helvetica, Tahoma, sans-serif; font-size: 13px; ">For nearly 51 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.