May 23 - 26, 2011    Munich , Germany
SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

Venue

Location: International Congress Centre Munich
The ICM – International Congress Centre Munich – is one of the most modern and successful congress centers in the world. Besides an experienced team of professionals, that is the result of its..
Contact Messegelnde, Am Messesee 2 81823 Mnchen Munich , Germany
+49 89 949 230 23

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