IEEE Workshop on RTL and High Level Testing (WRTLT) 2011

The purpose of this workshop is to bring researchers and practitioners on VLSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing. The twelfth workshop on RTL and high level testing (WRTLT'11) will be held in conjunction with the 20th Asian Test Symposium (ATS'11). The workshop aims to encourage the presentation and discussion of truly innovative and “out-of-the-box” ideas aimed at addressing these challenges of high level test. We hope the workshop will provide an ideal forum for future complex system test at higher level of abstraction.