IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR) 2012
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ASTR 2012 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market. The program will feature industry leading keynote speakers and selected presentations.
Organizer & Venue for IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR)
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Organizer
IEEE
445 Hoes Lane, Piscataway, NJ 08854-1331, USA
Tel: +1 732/981-0060
Fax: +1 732/981-1721,
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Venue
Holiday Inn Toronto Downtown Centre
30 Carlton Street Toronto , Ontario M5B 2E9 Canada
Ontario, , Canada
Tel: 1-416-9776655
Fax: 1-416-6462182