April 25 - 28, 2011
span class="Apple-style-span" style="color: rgb(14, 85, 49); font-family: Arial, Helvetica, sans-serif; font-size: 11px; line-height: 16px; ">The VLSI-DAT was spun-off in 2005 from the influential 22-year-old International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA). 2 symposia were held jointly in the same week with two-day overlap. The 2010 VLSI-DAT has attracted 300 attendees with a very high-quality program featuring 3 keynote speeches, 1 joint session on 3D IC, 4 invited talks, over 70 technical papers, 4 tutorials on hot topics and 8 industrial talks. In 2011, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium.

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