May 17 - 19, 2010    Monterey CA , Etats-Unis d’Amérique
• Backscattering electron diffraction
• Characterization of nanoparticles
• Confocal and other optical microscopy techniques
• Cryo-SEM
• Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions
• Helium ion microscopy
• Fast x-ray spectrometry

Lieux de Rendez-Vous

Location: Portola Hotel
Contact 2 Portola Plaza Costa Mesa , USA

Evénements Liés

SPIE Scanning Microscopy 2012 15 May, 2012
SPIE Scanning Microscopy 2011 15 May, 2011
SPIE Scanning Microscopy 2010 May 17 - 19, 2010
SPIE Scanning Microscopy 2009 May 4 - 7, 2009