International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 2012
conferenze > Engineering conferenze > International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
April 23 - 25, 2012
Hsinchu , Taiwan
The VLSI-DAT was spun-off in 2005 from the influential 22-year-old International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA). 2 symposia were held jointly in the same week with two-day overlap. The 2011 VLSI-DAT has attracted more than 400 attendees with a very high-quality program featuring 3 keynote speeches, 1 joint session on Automotive, 4 invited talks, over 70 technical papers, 4 tutorials on hot topics and 8 industrial talks. In 2012, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap.
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