International Electrostatic Discharge Workshop (IEW) 2013

The International ESD Workshop (IEW) will be held at Airlie Conference Center (Warrenton, Virginia, USA). 

This workshop provides a unique environment for envisioning, developing, and sharing ESD design and test technology for present and future semiconductor applications. Hence, this year’s technical focus is evolution, organized in three themes: More Moore, More than Moore, and Evolution in Standardization and Characterization (Moore’s law describes a long-term trend in the history of computing hardware: the number of transistors that can be placed inexpensively on an integrated circuit doubles approximately every two years). Linked to each subtheme expect high quality invited seminars, invited talks, discussion groups (DGs) and special interest groups (SIGs) covering ESD on advancing CMOS beyond the silicon roadmap, the relation between EMC and ESD, EOS, and System Level ESD.

The technical program includes advances in system level and high voltage ESD, as well as studies of component protection ESD testing, case studies, and design of ESD protections. An expanded poster format provides an opportunity for deep technical discussions and networking. As an added highlight, Wednesday afternoon is left free for exploration of the local area, extended technical discussions, sports, or relaxation. This exciting and well balanced program was put together specifically to address the needs and interests of those working in the field of ESD and for the benefit of their companies.
Both attendees and their organizations gain from this investment in learning.