IEEE International Reliability Physics Symposium (IRPS) 2012

IRPS consists of three days (Tues-Thurs, April 17-19) of plenary and parallel technical sessions presenting original, state-of-the-art work.

For 50 years, IRPS has been the premier conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.

IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world. We look forward to seeing you in Anaheim!