May 22 - 27, 2011    Мюнхен , Германия
SPIE Optical Metrology is the premier conference in Europe that brings together scientists, engineers, researchers, and applications or product developers engaged in optical metrology, optical measurement systems, and optics for arts, architecture, and archaeology.

Место проведения

Location: Munich Germany
Обратная связь Messegelände, Entrance North Munich , Germany

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SPIE Optical Metrology May 22 - 27, 2011