International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 2010
カンファレンス > Engineering カンファレンス > International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
April 26 - 29, 2010
Hsinchu , 台湾
The 2010 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) will be held in the Ambassador Hotel, Hsinchu, TAIWAN on April 26-29, 2010. Sponsored by Industrial Technology Research Institute (ITRI) and the Institute of Electrical and Electronics Engineers (IEEE), the VLSI-DAT provides a forum for presenting new innovations and achievements related to VLSI design, automation, and test. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after presentation in the symposium.
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