April 25 - 28, 2011
span class="Apple-style-span" style="color: rgb(14, 85, 49); font-family: Arial, Helvetica, sans-serif; font-size: 11px; line-height: 16px; ">The VLSI-DAT was spun-off in 2005 from the influential 22-year-old International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA). 2 symposia were held jointly in the same week with two-day overlap. The 2010 VLSI-DAT has attracted 300 attendees with a very high-quality program featuring 3 keynote speeches, 1 joint session on 3D IC, 4 invited talks, over 70 technical papers, 4 tutorials on hot topics and 8 industrial talks. In 2011, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium.

開催地

Sorry, this event is quite new so we couldn't find any venue information.
Please check again in the near future.

関連イベント

International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 28 - 30, 2014
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 22 - 24, 2013
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 23 - 25, 2012
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 25 - 28, 2011
International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 26 - 29, 2010
2009 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) April 27 - 30, 2009