Conference · Costa Mesa, California
SPIE Scanning Microscopy 2010
Biotechnology · Science
Dates17–19 May 2010This edition has ended
RunningSince 2009Annual · 4 editions on record
Last checked12 Nov 2026Organiser website checked
This is the 2010 edition. It has ended. See SPIE Scanning Microscopy's current page for the next dates.
Key numbers
- Editions on record
- 4first in 2009
About SPIE Scanning Microscopy
• Backscattering electron diffraction
• Characterization of nanoparticles
• Confocal and other optical microscopy techniques
• Cryo-SEM
• Focused ion beam microscopy/scanning microscopy and sample modification with beams of ions
• Helium ion microscopy
• Fast x-ray spectrometry
From our listing of this edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2012 | 15 May 2012 | Costa Mesa, California | — | — |
| 2011 | 15 May 2011 | Costa Mesa, California | — | — |
| 2010 | 17–19 May 2010 | Portola Hotel Costa Mesa, California | — | — |
| 2009 | 4–7 May 2009 | Portola Hotel Costa Mesa, California | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.