Conference
IEEE International Test Conference (ITC) 2010
Exhibition Industry, Convention Industry
Dates2–4 Nov 2010This edition has ended
VenueTo be confirmedVenue not in our records
RunningSince 2010Frequency unknown · 2 editions on record
Last checked12 Nov 2026Organiser website checked
This is the 2010 edition. It has ended. See IEEE International Test Conference (ITC)'s current page for the next dates.
Key numbers
- Editions on record
- 2first in 2010
About IEEE International Test Conference (ITC)
TC will have three workshops taking place November 4-5 2010 at the Austin Convention Center. This year the workshops are the First IEEE International Workshop on
Testing Three-Dimensional Stacked Integrated Circuits
(3D-Test), the 2nd IEEE International Workshop on Test and Validation of High Speed Analog Circuits (TVHSAC) and the IEEE International Workshop on Defect and Data-Driven Testing (D3T 2010).
From our listing of this edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2014 | 21–23 Oct 2014 | Washington State Convention & Trade Center Seattle, Washington | — | — |
| 2010 | 2–4 Nov 2010 | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.