Workshop · Shanghai, China
IEEE Eleventh Workshop on RTL and High Level Testing (WRTLT) 2010
Exhibition Industry, Convention Industry
Dates5–6 Dec 2010This edition has ended
RunningSince 2010Annual · 6 editions on record
Last checked12 Nov 2026Organiser website checked
This is the 2010 edition. It has ended. See IEEE Workshop on RTL and High Level Testing (WRTLT)'s current page for the next dates.
Key numbers
- Editions on record
- 6first in 2010
About IEEE Workshop on RTL and High Level Testing (WRTLT)
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.
The eleventh workshop on RTL and high level testing (WRTLT'10) will be hold in conjunction with the 19th Asian Test Symposium (ATS'10) in Shanghai, China. We hope and expect this workshop provides an ideal forum for frank discussion on this important topic for the future system-on-a-chip (SoC) devices.
From our listing of this edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2015 | 21–22 Nov 2015 | Toki Messe Niigata Convention Center Niigata, Japan | — | — |
| 2014 | 21–22 Nov 2014 | Toki Messe Niigata Convention Center Niigata, Japan | — | — |
| 2013 | 21–22 Nov 2013 | Toki Messe Niigata Convention Center Niigata, Japan | — | — |
| 2012 | 22–23 Nov 2012 | Toki Messe Niigata Convention Center Niigata, Japan | — | — |
| 2011 | 25–26 Nov 2011 | Malaviya National Institute of Technology Rajasthan, India | — | — |
| 2010 | 5–6 Dec 2010 | Four Points by Sheraton Shanghai Daning Shanghai, China | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.