Conference · Osaka, Japan

ICMTS Conference 2013

Electronics · Micro & Nano Technologies

Dates25–28 Mar 2013This edition has ended
VenueOsaka University NakanoshimaOsaka, Japan
RunningSince 2011Annual · 4 editions on record
Last checked12 Nov 2026Its old website no longer answers
This is the 2013 edition. It has ended. See ICMTS Conference's current page for the next dates.

Key numbers

Floor space
NULLin 2014, organiser's figure
Editions on record
4first in 2011

About ICMTS Conference

The 26th International Conference on Microelectronic Test Structures (ICMTS 2013) will be held at Osaka University Nakanoshima Center, Osaka, Japan, bringing together designers and users of test structures to discuss recent developments and future directions.

From our listing of this edition. Details may have changed since.

Editions

YearDatesWhereExhibitorsVisitors
201424–27 Mar 2014Osaka University Nakanoshima
Osaka, Japan
——
201325–28 Mar 2013Osaka University Nakanoshima
Osaka, Japan
——
201219–22 Mar 2012Catamaran Resort Hotel
San Diego, California
——
20114–7 Apr 2011——

Past editions from the bvents archive (2008–2019) and organiser figures where they were published.

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