International Semiconductor Conference (CAS) 2013

The 2013 International Semiconductor Conference (CAS 2013) – former Annual Semiconductor Conference – is now at its 36th annual sequence and 23th edition with International participation. The aim of the conference is two–fold. First of all, it provides a forum of debate on selected topics for scientific research and technological development. Secondly, it is an occasion for the participants to broad their perspective through invited papers and tutorials.

TOPICS: Contributions in solid-state devices and (sub)systems are called in the following domains.
- Simulation and fabrication of microstructures and microsystems:
surface and bulk micromachining, microengineering techniques, electro-opto-mechanical microsystems, microsensor and actuator integration, signal processing, computational intelligence and system interfacing, biosensors and microsystems for biomedical application; optical, opto-electronic and photonic functional components, RF MEMS;
- Science and technology of nanostructures and nanostructured materials:
composite nanoparticles and nanostructures with selective properties, nanostructures and nanostructured materials with special properties, nanotechnologies and nanostructure;
- Semiconductor device physics and technology:
device modelling and simulation, silicon and compound semiconductor devices, heterostructures, advanced materials and processes, reliability and defect engineering;
- Design and technology of microelectronic components:
microelectronic, microphotonic and microwave integrated subsystems, devices and modules for power control and conversion, specialized electronic circuits integrated in the microelectronic technology, testing and reliability;