International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 2011

The VLSI-DAT was spun-off in 2005 from the influential 22-year-old International Symposium on VLSI Technology, Systems, and Applications (VLSI-TSA). 2 symposia were held jointly in the same week with two-day overlap. The 2010 VLSI-DAT has attracted 300 attendees with a very high-quality program featuring 3 keynote speeches, 1 joint session on 3D IC, 4 invited talks, over 70 technical papers, 4 tutorials on hot topics and 8 industrial talks. In 2011, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium.