International Symposium on VLSI Design, Automation and Test (VLSI-DAT) 2013

In view of the exploding popularity of electronic consumer products and the interrelationships between the technology and design communities, the executive committees of the 2012 VLSI-DAT and VLSI-TSA symposia not only planned one joint plenary session featuring two excellent keynote speeches by Dr. Ya-Qin Chang of Microsoft and Dr. Philippe Magarshack of STMicroelectronics, two joint invited sessions on the first and second day of the conference were also organized to stimulate interactions between these groups in the course of the collocated three-day event. Please check the spotlight for more information about the 2012 VLSI-DAT and VLSI-TSA symposia,

The 2013 International Symposium on VLSI Design, Automation and Test (2013 VLSI-DAT) will be held in the Ambassador Hotel, Hsinchu, Taiwan during April 22-24, 2013. Sponsored by Industrial Technology Research Institute (ITRI) and technically sponsored by the Institute of Electrical and Electronics Engineers (IEEE), the VLSI-DAT provides excellent opportunities for close interaction between industrial and scientific researchers via presentations on innovations and achievements related to VLSI design, automation and test. In 2013, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap.

In response to the need of interactions between the technology and design communities, delegates registered for either 2013 VLSI-DAT or 2013 VLSI-TSA will be able to attend the program of both symposia. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium.