IEEE Semiconductor Wafer Test Workshop (SWTW) 2010

The IEEE Semiconductor Wafer Test Workshop (SWTW 2010) is the only IEEE Components, Packaging, Manufacturing Technology (CPMT) Society event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.

The two and one half-day event starts Sunday afternoon with registration, a reception, a buffet dinner, and a panel discussion. The conference adjourns on Wednesday at noon, in time to get most participants back to work by Thursday morning. SWTW has grown to almost 500 attendees with more international visitors each year.