IEEE Semiconductor Wafer Test Workshop (SWTW) 2011

The IEEE Semiconductor Wafer Test Workshop (SWTW 2011) is the only IEEE Components, Packaging, Manufacturing Technology (CPMT) Society event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.