Workshop
IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR) 2010
Electronics · Engineering
Key numbers
- Floor space
- NULLin 2015, organiser's figure
- Editions on record
- 6first in 2010
About IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR)
ASTR 2010 will provide a forum to bridge gaps in knowledge and share ideas that address intra and inter industry endeavors to limit and eliminate field failures of products. The focus will be on rapidly finding design weaknesses, developing robust systems, and improving strategies to cost effectively screen defects and weaknesses in electronic and electro-mechanical hardware and structural systems while reconciling twin needs of obtaining high product quality and reliability with that of low product development and manufacturing costs and timely introduction of new products to market.
From our listing of this edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2015 | 9–11 Oct 2015 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2014 | 9–11 Oct 2014 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2013 | 9–11 Oct 2013 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2012 | 17–19 Oct 2012 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2011 | 28–30 Sep 2011 | Hyatt at Fisherman's Wharf San Francisco, California | — | — |
| 2010 | 6–8 Oct 2010 | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.