Workshop · Ontario, Canada
IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR) 2012
Electronics · Engineering
Dates17–19 Oct 2012This edition has ended
RunningSince 2010Annual · 6 editions on record
Last checked12 Nov 2026Organiser website checked
This is the 2012 edition. It has ended. See IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR)'s current page for the next dates.
Key numbers
- Floor space
- NULLin 2015, organiser's figure
- Editions on record
- 6first in 2010
About IEEE/CPMT Workshop on Accelerated Stress Testing & Reliability (ASTR)
ASTR 2012 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product Quality and Reliability with low product development cost and time to market. The program will feature industry leading keynote speakers and selected presentations.
From our listing of this edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2015 | 9–11 Oct 2015 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2014 | 9–11 Oct 2014 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2013 | 9–11 Oct 2013 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2012 | 17–19 Oct 2012 | Holiday Inn Toronto Downtown Centre Ontario, Canada | — | — |
| 2011 | 28–30 Sep 2011 | Hyatt at Fisherman's Wharf San Francisco, California | — | — |
| 2010 | 6–8 Oct 2010 | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.