Workshop · Lake Tahoe, California
IEEE International Integrated Reliability Workshop (IIRW)
Information Technology · General
Key numbers
- Editions on record
- 6first in 2010
About IEEE International Integrated Reliability Workshop (IIRW)
The IEEE International Integrated Reliability Workshop (IRW) originated from the Wafer Level Reliability Workshop in 1982. The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, paper presentations, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and future semiconductor applications as well as ample opportunity for discussions and interactions with colleagues.
Hot reliability topics for the workshop include: SiGe and strained Si, III-V, SOI, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, organic electronics, emerging memory technologies and future "nano"-technologies, NEMS/MEMS, photovoltaics, transistor reliability including hot carriers and NBTI/PBTI, Cu interconnects and low-k dielectrics, product reliability and burn-in strategy, impact of transistor degradation on circuit reliability, reliability modeling and simulation, optoelectronics, single event upsets.
IIRW 2012 will include a special resistive memory invited session. Resistive memory abstract submissions are also encouraged. Additional hot reliability topics for the workshop include: high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, reliability modeling and simulation, optoelectronics, and single event upsets.
From our listing of the 2013 edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2015 | 13–17 Oct 2015 | Stanford Sierra Conference Center Lake Tahoe, California | — | — |
| 2014 | 13–17 Oct 2014 | Stanford Sierra Conference Center Lake Tahoe, California | — | — |
| 2013 | 13–17 Oct 2013 | Stanford Sierra Conference Center Lake Tahoe, California | — | — |
| 2012 | 9 Sep 2012 | Stanford Sierra Conference Center Lake Tahoe, California | — | — |
| 2011 | 16–20 Oct 2011 | Stanford Sierra Conference Center Lake Tahoe, California | — | — |
| 2010 | 17–21 Oct 2010 | Stanford Sierra Conference Center Lake Tahoe, California | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.
Questions
When is IEEE International Integrated Reliability Workshop (IIRW)?
The next dates haven't been confirmed. The last edition we have on record was 13–17 Oct 2015.
Where is it held?
The 2013 edition was at Stanford Sierra Conference Center, Lake Tahoe, California. The organiser hasn't confirmed the venue for this edition yet.
How often does it take place?
Annual, judging by the 6 editions on record since 2010.