Convention · Rome, Italy
European Symposium on Reliability of Electron devices and Failure analysis (ESREF) 2010
Electronics · Semiconductor
Dates11–15 Oct 2010This edition has ended
RunningSince 2010Annual · 6 editions on record
Last checked12 Nov 2026Its old website no longer answers
This is the 2010 edition. It has ended. See European Symposium on Reliability of Electron devices and Failure analysis (ESREF)'s current page for the next dates.
Key numbers
- Floor space
- NULLin 2015, organiser's figure
- Editions on record
- 6first in 2010
About European Symposium on Reliability of Electron devices and Failure analysis (ESREF)
The conference is intended to bring together young researchers, scientists, engineers and famous experts working in the field of reliability of the consolidated and the emerging electron devices. Researchers in academia are expected to join the workshop, but also engineers in small start-up companies and from major industries are strongly interested in participating.
From our listing of this edition. Details may have changed since.
Editions
| Year | Dates | Where | Exhibitors | Visitors |
|---|---|---|---|---|
| 2015 | 30 Sep – 4 Oct 2015 | Palais des Congres Arcachon Arcachon, France | — | — |
| 2014 | 30 Sep – 4 Oct 2014 | Palais des Congres Arcachon Arcachon, France | — | — |
| 2013 | 30 Sep – 4 Oct 2013 | Palais des Congres Arcachon Arcachon, France | — | — |
| 2012 | 1–5 Oct 2012 | University of Bordeaux Bordeaux, France | — | — |
| 2011 | 3–7 Oct 2011 | University of Bordeaux Bordeaux, France | — | — |
| 2010 | 11–15 Oct 2010 | Summit Hotel Rome, Italy | — | — |
Past editions from the bvents archive (2008–2019) and organiser figures where they were published.