Convention · Arcachon, France

European Symposium on Reliability of Electron devices and Failure analysis (ESREF) 2013

Electronics · Semiconductor

Dates30 Sep – 4 Oct 2013This edition has ended
VenuePalais des Congres ArcachonArcachon, France
RunningSince 2010Annual · 6 editions on record
Last checked12 Nov 2026Its old website no longer answers

Key numbers

Floor space
NULLin 2015, organiser's figure
Editions on record
6first in 2010

About European Symposium on Reliability of Electron devices and Failure analysis (ESREF)

ESREF 2013, the 24th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Arcachon (France) .
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

This event is organised by the IMS Laboratory (University Bordeaux 1, UMR CNRS 5218, IPB ) and ADERA Service with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)

From our listing of this edition. Details may have changed since.

Editions

YearDatesWhereExhibitorsVisitors
201530 Sep – 4 Oct 2015Palais des Congres Arcachon
Arcachon, France
——
201430 Sep – 4 Oct 2014Palais des Congres Arcachon
Arcachon, France
——
201330 Sep – 4 Oct 2013Palais des Congres Arcachon
Arcachon, France
——
20121–5 Oct 2012University of Bordeaux
Bordeaux, France
——
20113–7 Oct 2011University of Bordeaux
Bordeaux, France
——
201011–15 Oct 2010Summit Hotel
Rome, Italy
——

Past editions from the bvents archive (2008–2019) and organiser figures where they were published.

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