Convention · Bordeaux, France

European Symposium on Reliability of Electron devices and Failure analysis (ESREF) 2011

Electronics · Semiconductor

Dates3–7 Oct 2011This edition has ended
VenueUniversity of BordeauxBordeaux, France
RunningSince 2010Annual · 6 editions on record
Last checked12 Nov 2026Its old website no longer answers

Key numbers

Floor space
NULLin 2015, organiser's figure
Editions on record
6first in 2010

About European Symposium on Reliability of Electron devices and Failure analysis (ESREF)

ESREF 2011, the 22nd European Symposium on Reliability of Electron Devices will take place at Bordeaux (France) from 3rd to 7th October 2011.

This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

This event is organised by the IMS Laboratory (UMR CNRS 5218, University Bordeaux 1, IPB ) and ADERA with the technical co-sponsorship of IEEE - Electron Devices Society, IEEE - Reliability Society and ANADEF association (French association of industrial labs working in failure analysis)

From our listing of this edition. Details may have changed since.

Editions

YearDatesWhereExhibitorsVisitors
201530 Sep – 4 Oct 2015Palais des Congres Arcachon
Arcachon, France
——
201430 Sep – 4 Oct 2014Palais des Congres Arcachon
Arcachon, France
——
201330 Sep – 4 Oct 2013Palais des Congres Arcachon
Arcachon, France
——
20121–5 Oct 2012University of Bordeaux
Bordeaux, France
——
20113–7 Oct 2011University of Bordeaux
Bordeaux, France
——
201011–15 Oct 2010Summit Hotel
Rome, Italy
——

Past editions from the bvents archive (2008–2019) and organiser figures where they were published.

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